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v1.1.0✓ Zero dependencies✓ Gaussian fit / integral✓ Multi-peak + Williamson-Hall✓ SNR & Kα₂ applicability check
1Import XRD data
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or drag a file here
Supports .xy .xye .csv .txt .dat .asc .ras .json and generic two-column text
2Pattern preview & peak-region selection
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3Scherrer crystallite size
Formula: D = Kλ/(βcosθ). β is the FWHM after subtracting instrumental broadening. This tool does not strip Kα₂. Use monochromated or externally corrected input; unresolved doublets can bias size. Select a Gaussian or Cauchy instrumental profile independently of width mode. High-angle weak peaks are more affected by background and microstrain. New "PtCo empirical (220 integral)" mode: when selected it auto-analyzes the (220) reflection, using a SNIP baseline + Gaussian width approximation-breadth Scherrer to estimate the crystallite size, with a TEM calibration factor C.
PtCo empirical calculation (220 peak integral → crystallite size): When this mode is selected it analyzes the (220) reflection by default (66°–71°) and auto-sets the width mode to integral breadth. A SNIP morphological baseline + Gaussian width approximation gives the net peak area and integral breadth; Scherrer D = Kλ/(βcosθ) gives the coherently diffracting domain size, then multiplied by an empirical calibration factor C (pending TEM calibration, default 1). Note: (220) is a fundamental reflection and is weak/broad in this alloy, strongly affected by microstrain/stacking faults; its suitability depends on overlap and anisotropic broadening; compare several clean reflections. Final crystallite size should be based on (111) and TEM.